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Solving Reliability and Sustainability Problems in Systems Engineering through Government, Academia and Industry Collaboration


   2013 Workshop on Accelerated Stress Testing & Reliability

  Accelerating Reliability into the 21st Century 

October 9 - 11, 2013 
San Diego, California

The challenge of managing Reliability in a dynamic global market is increasing.   ASTR 2013 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures.  The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market.  The program will feature industry leading keynote speakers and selected presentations.


These Webinars are free sneak previews of the tutorials that will be presented on the first day of the workshop
IEEE ASTR Webinar Series
Call for Presentations!


Call for Presentation Topics

  1. Re-Thinking and Re-Visiting Qualification Spec
  2. ASTR in Energy Efficient Hardware/Systems
  3. Accelerated Testing & Field Failures
  4. COTS Components in military hardware/systems
  5. Failure Analysis (FA) & Prognostics and Health Management
  6. Predictive Modeling & Field Failures
  7. Accelerated Software Testing and Analysis
  8. Product Robustness & Cost Control
  9. Accelerated Design Tool
  10. Future of AST techniques
  11. Future of testing within Medical
  12. Future of testing within Military
  13. Clean Tech
  14. Prognostics
Important Dates:

    Abstracts due:  May 31st
      Email abstract submissions to:  don.gerstle@gmail.com   

    Presentation draft due:  July 31st

    Final presentation due:  Sept 15th
Workshop Registration is now open!
Hotel information and discount registration is available!

Accelerated Reliability Growth Testing

Milena Krasich, Senior Principal Systems Engineer, Raytheon IDS

This tutorial will cover the following topics:
1) Reliability Growth Test overview/objectives
2) Explain traditional Reliability Growth test methodology
3) Show shortcomings of the traditional methods
4) Show principles of the Physics of Failure test methodology
5) Show how the Reliability growth test based on PoF is constructed
6) Show how the expected stresses are applied and accelerated
7) Show reliability measures
8) Show advantages of the test PoF test design and acceleration
9) Show achieved considerable test cost reduction.

   Wednesday July 10    11:30am EDT:  

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40 Years of HALT:  What Have We Learned?

By: Mike Silverman, Founder/Managing Partner, Ops A La Carte

HALT began 40 years ago with a simple idea of testing beyond specifications in order to better understand design margins. Over the past 40 years, thousands of engineers around the world have been exposed to the concepts of HALT and have tried the techniques.

This tutorial will explore what we have learned in the past 40 Years and what the future of HALT could be? Register Click for more information

   September 12th

Prognostics as a Tool for Reliable Systems

By: Doug  Goodman, President of Ridgetop Group

Electronics are the keystone to successful deployment of complex systems (50+ MPUs in an automobile)

Large MTBF and Statistical Process Control and Centering methods are not sufficient alone for reliability due to “outliers” (e.g. Toyota Prius, Deepwater Horizon Drilling Rig, Boeing 787)

Ridgetop technology exists to pinpoint degrading systems before they fail; supporting operational readiness objectives and cost-saving Prognostics/Health Management (PHM) and Condition Based Maintenance

   Wednesday May 1   11:30am PDT:

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Robust Design and Reliability Engineering Synergy

By:  Lou LaVallee, Senior Reliability Consultant, Ops A La Carte

Robust Design (RD) Methodology is discussed for hardware development. Comparison is made with reliability engineering (RE) tools and practices. Differences and similarities are presented.   

Proximity to ideal function for robust design is presented and compared to physics of failure and other reliability modeling and prediction approaches.  Measurement selection is shown to strongly differentiates RD and reliability engineering methods.  When and how to get the most from each methodology is outlined. Pitfalls for each set of practices are also covered.

   Wednesday April 10    11:30am PDT

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Sponsored by the IEEE CPMT Society and the ASQ Reliability Division

Accelerating Reliability in the 21st Century  

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Last updated on May 2nd, 2012 by c.walter.fenk@intel.com  |                   Nondiscrimination Policy