ASTR 2009

Workshop on Accelerated Stress Testing & Reliability 


"Renewable Reliability"



Sponsored by the IEEE/CPMT TC-ASTR Committee 





Was Held October 7-9, 2009

Jersey City, NJ



Hyatt Regency Jersey City








Over the last few years, Accelerated Stress Testing & Reliability (ASTR) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the ASTR Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to operation and and destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and efficient an effective sampling screens to monitor for manufacturing excursions with high combined stresses (beyond end-use specifications) for shorter lengths of time. The 2009 workshop will focus on ASTR topics in renewable reliability. This theme will be timely, considering emerging world wide investments towards development and commercialization of sustainable and green energy technologies to generate economic growth and environmental security. The workshop will be held at the Hyatt Regency Jersey City on Hudson, overlooking the New York City skyline.  







Scheduled Presentations: Click here to download a PDF copy of current schedule.



Don Gerstle

Sampsa Kuusiluoma

SESSION CHAIRS (Please email your abstract submission to the appropriate Session Chair):

Margaret Stern

Ephraim Suhir

Case Studies

Haiyu Qi


Charles Cohn

Physics of Failure


Sambit Saha



Walter Fenk


The 2009 PowerPoint Presentation Template can be accessed by clicking here

The 2009 PowerPoint Speakers Intro Template can be accessed by clicking here

Exhibitors for 2009










Qualmark Corporation




Hotel Information

Here is the info for registering for the discounted rate at the hotel:
Go on Hyatt's Website:


The IEEE /CPMT / TC-7 Workshop Committee
General Chair - Cheryl Tulkoff - Phone: 512-913-8624 -
Local Host - Charles Cohn - Phone: 512-372-8887 -
Finance Chair- John Proulx - Phone:310-257-3714 -
Exhibitor Chair- Dennis Pachucki - Phone:  408-309-5206 -
Website Chair - Kirk Gray - Phone: 512-723-1374 -
Publicity Chair - Mark Chrusciel - Phone: 513-772-8810 -
Publicity Co-Chair- Teresa Steinburg - Phone: 616-499-5889 -
University Liaison - Ephraim Suhir-Phone: 650-969-1530 -
University Liaison - Abhijit Dasgupta-Phone: 650-969-1530  -
Technical Program Chair - Sampsa Kuusiluoma-
Technical Program Co-Chair - Don Gerstle -Phone:  520-395-1800 -
Keynote Session - Margaret Stern -  Phone: 703-724-4235 -
Physics of Failure Session - Saha Sambit- Phone: 607-770-3946 -
Reliability Session - Vasu Vasudevan - Phone: 503-696-2936 -
Case Studies Session - Haiyu Qi - Phone: 713-939-2621  -
Equipment Session - Walter Fenk- Phone: 503-696-2922 -
Technical Reviewer - Milena Krasich- Phone: 360-394-7558 -
Artwork Coordinator - John Schneider - Phone: 503-696-5576 -
Proceedings CD Editor - Vince Roland - Phone: 509 939-8751 -
News Letter Editor - Mike Silverman - Phone: 408-472-3889 -
Visit the TC-7 home page
Revised: 10-07-09