SCHEDULE:
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TRACK / SESSION |
COMMITTEE TRACK / SESSION CHAIR |
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Keynotes |
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Tutorials |
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Physics of Failure |
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Reliability |
Haiyu Qi, Dell |
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Equipment |
Mark Chrusciel, CSZ |
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Case Studies |
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Technical Program |
Click HERE to download a PDF outline of the schedule.
Each speaker's bio (if available) can be viewed by clicking on the speaker's name. The abstract (if available) can be viewed by clicking on the paper title.
| 31-Oct | 1-Nov | 2-Nov | ||
| 7:00 AM | Breakfast | Breakfast | Breakfast | |
| 7:45 AM | ||||
| 7:50 AM | ||||
| 7:55 AM | ||||
| 8:00 AM |
Welcome Remarks Committee |
Welcome Remarks | Welcome Remarks | |
| 8:05 AM | Committee | Committee | ||
| 8:10 AM | ||||
| 8:15 AM |
Welcome Remarks:
CALCE / UM |
Keynote 1 | Keynote 2 | |
| 8:20 AM | Charles Cohn | Tony Avak | ||
| 8:25 AM | Trends in Substrate Technologies and Their Impact on Reliability | Reliability Modeling and Testing Needs for Optical Fiber Based Avionics | ||
| 8:30 AM | Track 1 Intermediate | Track 2 Advanced | ||
| 8:35 AM | ||||
| 8:40 AM | ||||
| 8:45 AM | ||||
| 8:50 AM | Ephraim Suhir | Abhijit Dasgupta | ||
| 8:55 AM | ||||
| 9:00 AM | Accelerated Life Testing (ALT), Predictive Modeling and the Probabilistic Design-For-Reliability Approach | Physics of Failure Strategies for AST:Qualifications and Quality Assurance | ||
| 9:05 AM | ||||
| 9:10 AM | ||||
| 9:15 AM | 5 minute restroom break | Invited Speaker 1 | Craig Hillman | |
| 9:20 AM | Developing a Pb-Free Qual Plan for High Reliability Applications | |||
| 9:25 AM | Non-destructive thermal and acoustic characterization of micro- and nano electronic devices and chips | |||
| 9:30 AM | ||||
| 9:35 AM | ||||
| 9:40 AM | ||||
| 9:45 AM | ||||
| 9:50 AM | ||||
| 9:55 AM | ||||
| 10:00 AM | Break | Break | Break | Break |
| 10:05 AM | 20 minutes | 20 minutes | 20 minutes | 20 minutes |
| 10:10 AM | ||||
| 10:15 AM | ||||
| 10:20 AM | T1 | T2 | Reliability Session Intro | Case Studies Intro |
| 10:25 AM | Accelerated Life Testing (ALT), Predictive Modeling and the Probabilistic Design-For-Reliability Approach, cont'd | Physics of Failure Strategies for AST:Qualifications and Quality Assurance | Gene Bridgers | David Francis |
| 10:30 AM | Effective Using Mildy Accelerated ORT | HALT of Alternators | ||
| 10:35 AM | ||||
| 10:40 AM | ||||
| 10:45 AM | ||||
| 10:50 AM | ||||
| 10:55 AM | ||||
| 11:00 AM | T6 | Mike Silverman et al. | Hong S. Liu | |
| 11:05 AM | Mark Millet | ERT: Early Reliability Test | Comparison Testing of Shock vs. Vibration ESS system | |
| 11:10 AM | Intellectual Property and Accelerated Testing: A Tale of Two Inventions | |||
| 11:15 AM | ||||
| 11:20 AM | ||||
| 11:25 AM | ||||
| 11:30 AM | ||||
| 11:35 AM | ||||
| 11:40 AM | ||||
| 11:45 AM | Announcements | |||
| 11:50 AM | Lunch | Announcements | ||
| 11:55 AM | 75 minutes | Lunch | ||
| 12:00 PM | Announcements | Announcements | Virtual tour of GSFC Flight Qual Lab | 60 minutes |
| 12:05 PM |
Lunch 90 minutes ASTR 2008 Committee Meeting |
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| 12:10 PM | ||||
| 12:15 PM | ||||
| 12:20 PM | ||||
| 12:25 PM | ||||
| 12:30 PM | ||||
| 12:35 PM | ||||
| 12:40 PM | ||||
| 12:45 PM | ||||
| 12:50 PM | ||||
| 12:55 PM | Arthur R.Zingher et al. | |||
| 1:00 PM | Gary M. Hazard | A Leading Indicator enables Better Life Test and Prognostication | ||
| 1:05 PM | Rapid Reliability Risk Assessment for Fiber Optic Components | |||
| 1:10 PM | ||||
| 1:15 PM | ||||
| 1:20 PM | ||||
| 1:25 PM | ||||
| 1:30 PM | T3 | T4 | ||
| 1:35 PM | Paul Parker | Wayne Tustin | Don Gerstle | Gustavo Plaza et al. |
| 1:40 PM | Power Supply Design and Test for Reliability | Simultaneous Multiaxis Vibration Testing & Screening | Power Conversion Reliability | Study of Vibration Monitoring and Failure Criteria Definition for Solder Interconnect |
| 1:45 PM | ||||
| 1:50 PM | ||||
| 1:55 PM | ||||
| 2:00 PM | ||||
| 2:05 PM | Mike Silverman | |||
| 2:10 PM | Hass Profile Fine Tuning Using Field Data | |||
| 2:15 PM | 5 minute restroom break | |||
| 2:20 PM | Physics of Failure Session Intro | |||
| 2:25 PM | Koustar Sinha et al., UMD | |||
| 2:30 PM | Mechanical strength of copper-silicon interface of planar power modules | |||
| 2:35 PM | ||||
| 2:40 PM | ||||
| 2:45 PM | Equipment Session Intro | |||
| 2:50 PM | Junyong Tao | |||
| 2:55 PM | Study on exciting signals and their influencing factors of RS machine | |||
| 3:00 PM | Break | Break | Break | |
| 3:05 PM | 20 minutes | 20 minutes | 20 minutes | |
| 3:10 PM | ||||
| 3:15 PM | ||||
| 3:20 PM | ||||
| 3:25 PM | T3 | T4 | Gayatri Cuddalorepatta et al., UMD | |
| 3:30 PM | Power Supply Design and Test for Reliability, cont'd | Simultaneous Multiaxis Vibration Testing & Screening cont'd | Durability Assessment of an Advanced Power Electronics Thermal Cooler | Closing |
| 3:35 PM | Statements | |||
| 3:40 PM | ||||
| 3:45 PM | ||||
| 3:50 PM | ||||
| 3:55 PM | ||||
| 4:00 PM | Equipment Panel | |||
| 4:05 PM | ||||
| 4:10 PM | ||||
| 4:15 PM | 5 minute restroom break | |||
| 4:20 PM | ||||
| 4:25 PM | ||||
| 4:30 PM | ||||
| 4:35 PM | ||||
| 4:40 PM | ||||
| 4:45 PM | ||||
| 4:50 PM | ||||
| 4:55 PM | ||||
| 5:00 PM | Announce Close of Day 1, Announce Exhibitor Reception | |||
| 5:05 PM | ||||
| 5:10 PM | ||||
| 5:15 PM | ||||
| 5:20 PM | ||||
| 5:25 PM | ||||
| 5:30 PM | Closing | |||
| 5:35 PM | Statements | |||
| 5:40 PM | Break | |||
| 5:45 PM | ||||
| 5:50 PM | ||||
| 5:55 PM | ||||
| 6:00 PM | ||||
| 6:05 PM | Reception | |||
| 6:10 PM | ||||
| 6:15 PM | ||||
| 6:20 PM | ||||
| 6:25 PM | ||||
| 6:30 PM | ||||
| 6:35 PM | ||||
| 6:40 PM | ||||
| 6:45 PM | ||||
| 6:50 PM | ||||
| 6:55 PM | ||||
| 7:00 PM | Odyssey | |||
| 7:05 PM | Dinner Cruise | |||
| 7:10 PM | ||||
| 7:15 PM | ||||
| 7:20 PM | ||||
| 7:25 PM | ||||
| 7:30 PM | ||||
| 9:00 PM | ||||