Workshop on Accelerated Stress Testing & Reliability
Sponsored by the IEEE/CPMT ASTR Committee and Co-Sponsored by UC Santa Cruz
THE 2006 ASTR WORKSHOP WILL BE HELD
October 4 - 6, 2006
San Francisco, California
|Tutorials||Technical Sessions||Speakers Info||Past Workshops|
Welcome to the ASTR Chairman’s Corner. This part of the website will serve to report on past activities and to inform on upcoming events.
I would like to personally invite you and your associates to participate in the 2006 ASTR workshop in San Francisco, CA. This committee is dedicated to communicating best practices of accelerated stress testing and reliability. We do this by hosting an annual three day interactive workshop located in a different area of the US each year. The committee members understand first hand the value ASTR brings to product development. (click here for more information about the ASTR workshop committee)
This year's workshop will be held at Sheraton Fisherman's Wharf in San Francisco, California.
2500 Mason Street, San Francisco, CA 94133
Ph: 415-627-6513 Fx: 415-989-9757
INDIVIDUAL HOTEL RESERVATIONS: Each individual guest must make their own reservations by Thursday, August 31, 2006.
HOTEL ONLINE REGISTRATION to book your hotel room at Sheraton Fisherman's Wharf and receive the discounted room rate of $135/night.
Or call 1-888-627-7024. You must identify yourself as a member of "Accelerated Stress Testing Reliability Conference" to receive the discounted room rate of $135/night.
The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions, Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.
Design of Experiments
Overall AST planning and management
Reliability of component packaging and/or assembly and/or systems
AST for specific systems: optoelectronic packaging, rf devices
Reliability of specific systems
Emerging technologies and future systems, such as MCM, System in Packaging, microsystems, nanotechnologies, and their reliability
Other AST issues
The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.
Powerpoint Templates to be used for Speaker's Bio
Template for presentations
Guidelines for Session Moderators
Exhibitors may also register online
ASTR 2005 - Austin, Texas
ASTR 2004 - Chicago, Illinois
ASTR 2003 - Seattle, Washington Make Your Plans Now!
ASTR 2002 - Montreal, Quebec, Canada ASTR 2007 will be held in Washington, DC
ASTR 2000 - Denver, Colorado
ASTR 1999 - Boston, Massachussetts
ASTR 1998 - Pasadena, California
ASTR 1997 - Dallas, Texas
ASTR 1996 - Ottawa, Canada
ASTR 1995 - Cupertino, California Return to TC-7 Home Page