ASTR 2005

Workshop on Accelerated Stress Testing & Reliability

Sponsored by the IEEE/CPMT ASTR Committee and Technically co-sponsored by the IEEE Reliability Society

Visit the ASTR 2006 web site here




OCTOBER 3 - 5, 2005










Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time.


Welcome to the ASTR Chairmanís Corner.  This part of the website will serve to report on past activities and to inform on upcoming events. 

I would like to personally invite you and your associates to participate in the 2005 ASTR workshop in Austin, Texas.  This committee is dedicated to communicating best practices of accelerated stress testing and reliability.  We do this by hosting an annual three day interactive workshop located in a different area of the US each year.      The committee members understand first hand the value ASTR brings to product development.  (click here for more information about the ASTR workshop committee)


Register Now!
Individual Registration
Exhibitor Registration




This year's workshop will be held at the DRISKILL HOTEL in Austin, Texas


Please ask for the "IEEE" discounted rate when making your hotel reservation. 

IEEE Discounted room rate is $139.00/night for a single room.

Register now, as rooms are limited! 

Reservations for discounted room rates must be made by September 19, 2005.

Reservations can be made by calling The Driskill Hotel at 512-474-5911 or 800-252-9367.





There are two SPECIAL EVENTS this year.  Monday evening, October 3, will include a dinner cruise with Capital Cruises.  Tuesday evening, October 4, will include a tour of Dell's Shock and Vibration Laboratory.  The special events are included in your registration fee.  Seating is limited, so please register early.  Contact Don Hayward to register.

Dell Reliability Labs tour will be conducted in accordance with U.S. Department of Commerce Export Compliance Regulations. Admittance will require advanced registration by close of conference proceedings on Monday, October 3rd. Entry into Dell Labs will also require a valid photo I.D.: driver's license, passport, or Government I.D. Additionally, no photographic equipment of any type will be permitted on the tour.

Keynote Speaker
This year's workshop will feature as Keynote Speaker Mr. Stuart D. Caffey, Vice President, Development, Desktop & Portable Systems, Dell, Inc.



Click here for the call for papers

Click here to read the abstracts

Click here to view the tentative schedule



Please email your proposal to the appropriate chair:       

Technical program - Overall program chair

Alex Porter


Track Chairs

Power Supplies

Paul Parker


Proactive Reliability Tools

John Proulx


Components/Pb Free


System Integration Box/Car Level

Alex Porter


Physics of Failure

Valerie Eveloy


Facilities, Labs, Procedures 

Francios Lafleur



Do you have a topic idea for an open forum panel discussion? 

Contact John Proulx with your suggestions.





The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions, Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.





The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.






Powerpoint Templates to be used for Speaker's Bio

Template for presentations





Click here for both Exhibitor information and the Exhibitor Registration Form












The IEEE /CPMT / TC-7 2005 Workshop Committee
Workshop General Chair - John Proulx - General Motors - Phone:310-257-3714 -
Technical Committee Chair - Mark Gibbel - Gibbel Corporation - Phone:310-791-1220 -
Technical Co-Chair - Alex Porter - Entela - Phone:616-247-0515 -
Technical Co-Chair - Francois Lafleur - CRIQ - Phone:514-383-1550 -
Local Co-Host - Ed Tinsley - Dell - 512-728-7774 -
Local Co-Host - Dave Rahe - Professional Testing, Inc. - Phone:512-244-3371 -
Local Co-Host - Kirk Gray - Dell Inc. - Phone:512-723-1374 -
Finance Chair - Don Hayward - Intel - Phone:253-371-5873 -
Asst. Finance Chair - Gil Bastien - Screening Systems, Inc. - Phone: 949-330-7466 -
Publicity Co-Chair - Cathy Postmus - Vibration Research - Phone:616-669-3028 -
Exhibitor Chair - Dennis Pachucki - Cisco Systems Inc. -
Registration Chair  - Gil Bastien - Screening Systems, Inc. - Phone: 949-330-7466 -
Webmaster - Cathy Postmus - Vibration Research - Phone:616-669-3028 -

Past IEEE/CPMT ASTR Workshops


ASTR 2004 - Chicago, Illinois       

ASTR 2003 - Seattle, Washington                                        Make Your Plans Now!

ASTR 2002 - Montreal, Quebec, Canada                           ASTR 2006 will be held in San Francisco, California

ASTR 2000 - Denver, Colorado                                                

ASTR 1999 - Boston, Massachussetts

ASTR 1998 - Pasadena, California

ASTR 1997 - Dallas, Texas

ASTR 1996 - Ottawa, Canada

ASTR 1995 - Cupertino, California                                    Return to TC-7 Home Page