Accelerated Stress Testing & Reliability
Oct 6 - 8, 2004 in Chicago, Illinois
at Holiday Inn Chicago-Mart Plaza
(Please ask for the "ASTR" rooms when making a reservation)
Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time.
You may also wish to consider attending SAE International's new "Accelerated Test Methods for Ground and Aerospace Vehicle Development" seminar, which is being held in conjuction with the ASTR 2004 Workshop in Chicago, Illinois, on October 4 & 5, 2004.
HAVE A TOPIC YOU WOULD LIKE TO DISCUSS?
Please email John Proulx with your suggestions for an open forum panel discussion
DAY 1 - TUTORIALS
The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.
DAYS 2 & 3 - TECHNICAL SESSIONS
The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.
Register by mail - please print & mail this PDF form
Many suppliers of AST equipment, instruments, and services will be present during the first two days.
|Back to TC-7 Home Page|