ASTR 2004

 

                    CLICK HERE TO VIEW THE WEB PAGE FOR THE ASTR 2005 WORKSHOP!

 

 

 

   

    

ASTR Chairman's Corner


Welcome to the ASTR Chairmanís Corner. This part of the website will serve to report on past activities and to inform on upcoming events.

 

"I want to personally invite you and your associates to participate in this yearís ASTR workshop in Chicago Ill."

     (more from the chairman...)

 

The IEEE /CPMT / TC-7 2004 Workshop Committee

General Chairman
John Proulx
GM 
Phone:310-257-3714
john.proulx@gm.com
 
 
Program Co-Chair
Alex Porter
Entela
Phone:616-247-0515
aporter@entela.com
 
 
Program Co-Chair
Dave Rahe
Professional Testing, Inc.
Phone:512-244-3371
drahe@ptitest.com
 
 
Local Co-Host
John Foss
Air Liquide
john.foss@airliquide.com
 
 
Local Co-Host
Rick Leeds
Cryogenic Resources
Phone:719-527-4264
cryores@aol.com
 
 
Finance Chair
Don Hayward
Intel
Phone:253-371-5873
don.r.hayward@intel.com
 
 
Publicity Co-Chair
Francois Lafleur
CRIQ
Flafleur@criq.qc.ca
 
 
Publicity Co-Chair
Cheryl Thierfelder
VBS Industries, Inc.
Phone:408-371-3303
cheryl@vbsflex.com
 
 
Publicity Co-Chair
Linda Hall
Entela, Inc.
Phone:616-247-0515
lhall@entela.com
 
 
Publication Chair
Mark Gibbel
Gibbel Corporation
Phone:310-780-9630
mark.gibbel@gibbelcorp.com
 
 
Exhibitor Co-Chair
Dennis Pachucki 
Cisco Systems Inc.
dpachuck@cisco.com
 
 
Exhibitor Co-Chair
Rick Leeds
Cryogenic Resources
Phone:314-542-2438
cryores@aol.com
 
 
Registration Chair 
Gil Bastien
Screening Systems, Inc.
Phone: 949-330-7466
gbastien@scrsys.com
 
 
Co-Webmaster
Kirk Gray
Dell Inc.
Phone:512-723-1374
kirk_gray@dell.com
 
 
Co-Webmaster
Cathy Postmus
Vibration Research
Phone:616-669-3028
cathy@vibtest.com
 
 
Tutorials
Tony Chan
h.a.chan@ieee.org
 
 
Tutorials
Paul Paroff
Advanced Input Devices
pparoff@advanced-input.com
 

Past IEEE/CPMT Workshops

 

ASTR 2003
Seattle, Washington

ASTR 2002
Montreal, (Quebec), Canada

ASTR 2000
Denver, Colorado

ASTR 1999
Boston, Massachussetts

ASTR 1997
Dallas, Texas

ASTR 1995
Cupertino, California

Workshop on

Accelerated Stress Testing & Reliability

Sponsored by the IEEE/CPMT ASTR Committee and Technically co-sponsored by the IEEE Reliability Society

Oct 6 - 8, 2004   in   Chicago, Illinois

at  Holiday Inn Chicago-Mart Plaza

(Please ask for the "ASTR" rooms when making a reservation)

Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time-to-market. The purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust, the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time.


You may also wish to consider attending SAE International's new "Accelerated Test Methods for Ground and Aerospace Vehicle Development" seminar, which is being held in conjuction with the ASTR 2004 Workshop in Chicago, Illinois, on October 4 & 5, 2004.

For more information, download this SAE seminar flyer and follow this link to their web page.


Quick Links:

Paper Topics

Abstracts
Day 1 - Tutorials
Days 2 & 3 - Technical Sessions
Registration Forms
Speakers Info
Sponsors & Exhibit information 


PAPER TOPICS

Call for Papers and Tutorials

HAVE A TOPIC YOU WOULD LIKE TO DISCUSS? 

Please email John Proulx with your suggestions for an open forum panel discussion

 

View the ABSTRACTS

  •  Advanced Approaches to AST
  •  Reliability Improvement Techniques
  •  AST Data Collection
  •  Advanced Data Analysis
  •  Failure Analysis Techniques
  •  Reliability Simulation and Modeling
  •  Physics of Failure Techniques
  •  Stress Screening Techniques
  •  AST Case Studies
  •  Stress Selection Amplitudes and Profiles
  •  Functional Test During Stress Testing
  •  AST Results on New Technologies
  •  ESD
  •  AST on hardware/software interactions
  •  AST impact on Business and Engineering Decisions
  •  Equipment and Facility considerations
  •  Vibration Selection

DAY 1 - TUTORIALS

Call for Papers and Tutorials

View the Schedule

The all day tutorial program will be held on the first day of the Workshop and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.

Tutorial Topics

  •  Failure analysis
  •  Design of Experiments
  •  AST Procedures
  •  AST Equipment
  •  Mechanical AST
  •  Thermal AST
  •  Overall AST planning and management
  •  Reliability of component packaging and/or assembly and/or systems
  •  AST for specific systems: optoelectronic packaging, rf devices
  •  Reliability of Specific systems
  •  Emerging technologies and future systems, such as MCM, System in Packaging, microsystems, nanotechnologies, and their reliability
  •  Other AST issues

Please email proposal to chairs Alex Porter , Dave Rahe , and Anthony Chan.


DAYS 2 & 3 - TECHNICAL SESSIONS

View the Schedule

The two day workshop program will present new and innovative Accelerated Stress Testing techniques in use today. Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis.


REGISTRATION FORM

Register by mail - please print & mail this PDF form


SPEAKERS INFO

Templates:

PowerPoint Templates to be used for Speaker's Bio
Template for presentations

Paper/Presentation Deadlines:

Final - July 30, 2004

SPONSORS

Registration Form and Exhibit Information

Many suppliers of AST equipment, instruments, and services will be present during the first two days.

                 

 

 

 

                                

 

 

                                  

   


 

 

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