ASTR 2004

 

ABSTRACTS

Abstract: World Class Reliability Using Multiple Environment Over Stress Test to Make it Happen
                By:Keki R. Bhote

                Title: President

                Organization: Keki R. Bhote Associates

           

Multiple Environment Over Stress Tests (MEOST), first developed at NASA to test the Lunar Module, achieves:
MEOST Principles are:
This paper will briefly describe the fundamental weaknesses of reliability prediction (e.g. MIL Handbook 217E etc.), reliability estimation (FMEA etc.) and reliability demonstration (Military & SAE Testing). It will also outline the weaknesses of HALT & HASS testing. It will go on to develop the 8 Stages of MEOST, resulting in a reliability prediction much earlier and more robust than traditional techniques. Finally, it will also illustrate the several uses of MEOST in industry that no other technique can achieve.
 

Abstract: Acoustical Stress Screening: HALT and ESS Case study
                By:François Lafleur, Ph.D.

        Organization: CRIQ, Centre de Recherche Industrielle du Québec

The ESSAD equipment or ESS Acoustical Device is intent to perform vibration HALT or ESS on electronic products and circuits using acoustical excitation. This equipment allows developing tailored vibration profile for each product that is adapted to its vibration modes. This article will describe the ESSAD equipment and will discuss about the operating procedure of a typical test program. Case studies on electronic equipments will show some typical results obtained by users. The economical outcome of the HALT/ESS process using the ESSAD will also be discussed the article will discuss about the HALT/ESS implantation process by a new user either by purchasing an HALT/ESS equipment or subcontract to a testing laboratory.

 

Abstract: Improving Hardware Robustness for New Product Launch
                By:Gary Hazard

        Organization: Tellabs

This presentation will focus on the implementation of a AST based prevention strategy to improve Reliability, Manufacturability and Yield. Many of us face the challenge of delivering products of a highly advance nature in an accelerating TTM Market place. The product’s Hardware is typically complex and heavy with cutting edge issues. We can address this challenge by utilizing robust hardware. Robustness hardware design can significantly increase production yields and greatly minimize external failure. Poor manufacturing yields result in on-going TTM delays and time consuming engineering follow-up. Reliability problems become field failures that erode credibility and result in a loss of reputation. This presentation will focus on the design and manufacturing process necessary to achieve and maintain high quality reliable hardware. Examples of both Optical and electronic hardware that have achieved both high yields and low field failures will be presented.

Abstract: Proving HALT/HASS Machine Effectiveness Using Fatigue Spectrums
                By:George Henderson

             Organization: GHI Systems, Inc.

Abstract: Moving from ORT to HASA
                By:Mike Silverman, C.R.E.

Abstract: Fault Tree Analysis Tutorial
                By:Milena Krasich

Abstract: Bugs, Hex and Dust: Obscure and Unique Stress Sources
                By:Alexander J. Porter

Abstract: Validation and Verification of a FMVT Process
                By:Karthik Balasubmaranian

Abstract: Power Supply Reliability
                By:Don Gerstle

Abstract: The Effect of Imposed Vibration Frequency on Failure Mode Identification
                By:Ted Fine

Abstract: A Viewpoint on Fatigue Metrics-- Benefits for HALT, HASS and More
                By:Stephen A. Smithson

Abstract: How Problems with Pneumatic Vibration Systems Go Undetected and their Effect on Accelerated Testing and Screening
                By:John Hess

Abstract: Return On Investment for HALT Tests
                By:Edmond L. Kyser

Abstract: Product Reliability through Stress Testing
                By:H. Anthony Chan and T. Paul Parker

Abstract: Complementing Accelerated Testing with Probabilistic Physics of Failure
                By:Anoop Rawat & Julius Wang

Abstract: A Standardized Methodology for measuring and evaluating Repetitive Shock tables
                By:Charles Felkins

Abstract: HALT Testing an RF Electronic Product
                By:Gil Bastien

Abstract: ACCELERATED LIFE TESTING (ALT) IN MICROELECTRONICS AND PHOTONICS:

                Its Role, Attributes, Challenges, Pitfalls, and Interaction with Qualification Tests

                By:E. Suhir

                Organization: University of Illinois at Chicago and ERS Co.

Abstract: A Simple Demonstration – Weak Design vs. Strong Design
                By:Troy J. Hartwig

Abstract: Learning To Use Acceleration Factors for Accelerated Testing
                By:Larry Edson

Abstract: HALT Chambers Suck
                By:Romano Annecchiarico, Gene Bridgers, and Renzo Cristina