Website of the 8th Annual

Workshop on Accelerated Stress Testing 


AST 2002

Held October 2, 3, and 4, 2002


MONTRÉAL, Quebec, Canada



Sponsored by the 

IEEE Components, Packaging and Manufacturing Technology Society (TC-7

And Technically Cosponsored by IEEE Reliability Society 

In addition to two days of technical presentations, this workshop will include a one-day tutorial from leaders in the field and a two-day exhibition featuring AST related suppliers such as

. A variety of topics was presented related to Accelerated Stress Testing including the following confirmed presentations. This is only a preliminary list of topics. Tutorials and additional schedules will be available in August of 2002.

Tutorials Presentations

Subject Company Speaker
History of Environmental Stress Screening AcceleRel Engineering Kirk Gray
Accelerated Stress Testing (AST) Overview San Jose State University H. Anthony Chan
AST Processes and Procedures Otis Elevator Mark Morelli
Thermal AST Qualmark Charles Felkins
Vibration Spectrum Tailoring vs. Temperature CRIQ Francois Lafleur
Generating Random Vibration for Accelerated Stress Testing Equipment Reliability Institute Wayne Tustin
Cookbook for Using Spectrum Analyzers on 6DOF Machines GHI Systems George Henderson

The Two Days of Presentations will include:

Presentation Title Company Author/Presenter
Two-Stress Accelerated Reliability Methodologies for Electronic Components, A Case Study NAVSEA Dahlgreen Divison, Systems Integration Branch Nick Strifas, Ryan Staats, and Massimo Ruzzene
In-Situ Solder Joint Reliability Analysis Under Thermal Cycling Nanyang Technological University, School of MPE, Singapore: Singapore Institue of Manufacturing Technology. John H.L. Pang, X. R. Zhang, Q.J. Liu and T.H. Low, X.Q.Shi, Z.P. Wang and Q.J. Yang
Life Estimating Techniques for Failure Mode Identification Testing Methods Entela, Inc. Alexander J. Porter
Often Overlooked HALT Benefits Sycamore Networks Gene Bridgers
HALT happens -- A Case History GHI Systems, Inc. George Henderson
Test Methodology for Impact Testing of Portable Electronic Products CALCE Electronic Products and Systems Center, University of Maryland Joe Varghese, Abhijit Dasqupta
Cost savings in Thermal Shocks. Angelantoni Industries, SpA - Italy Marco Perego
Economic Justification of Halt Tests: The relationship between operating margin, test costs, and the cost of field returns Cisco Systems, Inc. Edmond L. Kyser, Nahum Meadowsong
AST for Operating Systems San Jose State University Michael Werner, J. Bozoarth, H. Anthony Chan
Highly Accelerated Life Testing - Testing With A Different Purpose Advantage Technical Sales Neill Doertenbach
Sample Size in Highly Accelerated Stress Audit (HASA) Anritsu Mekonen Buzuayene and Barry Ma
A Mechanical Integrity Approach to Interconnect Design Teradyne, Inc. Nathan W. Pascarella
A beginners guide to HALT C. Hanse Industries Chris Hanse
Standard method for Board Level Drop Test of Components for Portable Electronic Applications Flextronics Dongji Xie



















To Order Extra copies of the IEEE/CPMT 2002 Workshop on Accelerated Stress Testing Please send the following information and $75.00 Check or Money Order for each copy (no credit card charges) to:






 The IEEE /CPMT AST Workshop 2002 Committee - Please contact for any questions regarding the specifics of the Workshop. Contact information is listed in the table below.

General Chair
Kirk Gray
AcceleRel Engineering
Phone 303-666-8726 
Gene Bridgers
Results MA
Phone 781-224-1977
Publicity Chair
Chris Hanse                     
C. Hanse Industries, Inc. 
Program Chair
H. Anthony Chan                   
San Jose
Phone 408-924-3656
Exhibitor Chair          
Dennis Pachucki           
Cisco Systems Inc.
Phone 408-853-7341
Local Host
Francois Lafleur                   
Phone 514-383-1550 ext 3519
Program Co-Chair
John Proulx
(310) 257-3714

This page last updated 10-9-02