Call for Abstracts
Workshop on Accelerated Stress Testing AST 2000
October 2 - 4, 2000
Sponsored by the IEEE
And Technically Cosponsored by IEEE Reliability Society
Technical Program Chair
T. Paul Parker
(972) 284 2295
408 285 5316
Publicity & Registration Chair
AcceleRel Engineering, Inc.
In addition to two days of technical presentations, this workshop will include a one-day tutorial from leaders in the field and a two-day exhibition featuring AST related suppliers.
Authors are invited to submit abstracts on a variety of topics related to Accelerated Stress Testing including the following targeted topics:
Advanced Approaches to AST
Electrodynamic vs. Repetitive Shock Vibration
Reliability Improvement Techniques
AST Data Collection/Analysis
Failure Analysis Techniques and Examples
Reliability Simulation and Modeling
Application of Physics of Failure Techniques
Stress Screening Techniques
AST Case Studies, including stress profiles
Stress other than temperature & vibration
Functional test During Stress Testing
AST Results on New Technologies
Contributed Abstracts must be recived by April 28th, 2000. Notification of acceptance will be provided by June 15th, 2000. All appropriate company and government clearances must be obtained prior to submission. Authors should submit their abstracts by the above date to the technical program chair via Email. Submissions should not exceed one page and should be submitted in a file format compatible with MS Word (WordPerfect, text, etc). Abstract title, author names, affiliations, phone number, mailing, and email addresses should begin each Abstract. A final copy of their manuscript or viewfoils is to be submitted by August 1st 2000. Your viewgraph presentation only will be printed in the proceedings. Three hardcopies of your final (camera ready) presentation package should be submitted in addition to a MS PowerPoint file. Overhead, slide, VGA (computer projection) and VCR facilities will be available for presenters.
Tutorial Topics Include:
A Block of rooms has been reserved at the Omni Interlocken Resort Hotel at a discounted price
of $109.00 per night for a single room and $119.00 for a double room for the days of the conference.
Please Specify the "IEEE Accelerated Stress Test" Reservations can be reached by phone (303) 438-6600.
For addition information, please contact one of the individuals shown on the left.