4th Annual
WORKSHOP ON
ACCELERATED STRESS TESTING
AST '98

 
 
       
     
       
     
       
     
   
     
 

Sponsored by IEEE's

Component, Packaging, & Manufacturing Technology (CPMT) Society
and
Reliability Society


          In Cooperation with:

NASA JPL Test Effectiveness Program

 
   
   
     
     
     
 

September 22, 23, 24 
Pasadena Convention Center
Pasadena, California

 
   
 
     
   
   
     
 

The Purpose of the Workshop and TC-7

Over the last few years, Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time to market. The Purpose of the AST Workshop is to share ideas on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electro-mechanical hardware that would result in failures during usage. These techniques are focused on testing electronic hardware to destruction limits and root cause investigation to determine the physics-of-failure. The goal of AST is to produce mature products at market introduction and, in making it robust,  the product can be screened for manufacturing defects with high combined stresses (beyond end-use specifications) for shorter lengths of time. 

 
   
 
   
   
     
 

(Past) Workshop Highlights

 
   
 
   
 
     
  Click here for the past TUTORIALS:  The all day tutorial program will be held on September  22 and features well respected experts sharing their experiences and hard learned lessons. Two parallel sessions , Basic AST and Advanced AST Subjects, will ensure that experienced practitioners as well as those who are just entering the field will find useful and interesting presentations.  The small workshop size along with the relaxed atmosphere ensure that your questions will be addressed.  0.9 Continuing Education Units will be credited to those attending this program

Click here for the past TECHNICAL SESSIONS:  The two day workshop program (September 23 & 24) will present new and innovative Accelerated Stress Testing (AST) techniques in use today.  Past workshops featured speakers discussing their accomplishments in providing accelerated reliability testing for a wide range of products as well as failure analysis techniques and data analysis. Click Here For Advanced Program Schedule



 
   
   
   
   
   
     
 


Past Committee

GENERAL CHAIR :
Michael Cooper
Nortel
P.O. Box 3511, Station C
Ottawa, Ontario, Canada  K1Y 4H7
Voice: 613-763-4244,  FAX: 613-763-8091

Other Committee Contacts, click on name to e-mail:
LOCAL ARRANGEMENTS:
Mark Gibbel, JPL
FINANCE
Cheryl Ascarrunz, Silicon Graphics
REGISTRATION:
Kirk Gray, AcceleRel Engineering
TUTORIALS:
H. Anthony Chan, AT&T
PUBLICITY:
Joseph Mantz, AT&T

PROGRAM: T. Paul Parker, Lucent Technologies
VENDOR EXHIBITS:
Dennis Pachucki, Compaq's Atalla Corporation

 
   
 
   
   
     
 

Tutorial Schedule   Advanced Program