2017 ASTR Conference ASQ Reliability Division IEEE Reliability Society


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One Day Accelerated Life Test (ALT) Course for ASTR

Date: September 26, 2017
Where: Austin Downtown Hilton Garden Inn
Instructor: James McLinn, Rel-Tech Group
Registration

Course Overview

ALT tools and techniques are shown in many reliability books as an application of statistical tools. The study of ALT basic and advanced examples in this course when combined with practical approaches will lead to fundamental understanding and practical test results.    
This course begins with ALT theory and expands to advanced examples to cover a wide range of problems with setting-up and analyzing an ALT. The ALT is actually a series of actions that can uncover hidden flaws before a product is released to the field. Learn easy and practical ways to approach a number of challenging ALT situations. Estimate reliability of a variety of components and products. This course is engineering oriented, but covers complex examples without difficult statistics. Examples will include single stresses at multiple stress levels; combined stress examples; handling non-linear behavior and what to do with interacting stress situations.

Course Objective

The successful attendee will learn how to use accelerated test principles that can improve hardware reliability for systems. Practical test design techniques are shown with detailed examples and complex case histories that supplement the theory. The attendee will come away with ways to perform difficult ALTs and also learn some approaches to avoid. This course will cover a variety of important topics.

Who Should Attend

Reliability engineers, design engineers, quality engineers, manufacturing engineers and their managers who are responsible for development and manufacture of long-lived systems or high reliability systems. ALT itself can sometimes be a costly and time consuming activity, it is best to get it right the first time.


 
Course Contents (8 hours):

Any effective ALT course would include the following list of topics.

 

Theory of ALT (90 minutes)

The Basics of Acceleration
The Stress versus Life concept for continuous and intermittent stress situations
Projecting life for electronics, materials and mechanical components
High Stress level problems and non-linear behavior
Common stresses to that find problems and failure modes
Examples of creating test plans for effective tests

 

Sample Size (30 Minutes)

Three ways to pick a sample size; three samples are never enough
Determining Confidence in test results
Influence of prior history on current results
Trade off of cost, time, sample size and stress

 

Stress Models (120 Minutes)

Models of Acceleration – Arrhenius, Power law, Eyring models Setting up Multi-Level single stress tests
When to combined stresses and how to do it well
How to handle the interaction of multiple stresses

 

Degradation Approaches and Data Analysis (150 Minutes)

Degradation models for reliability tests
Weibull Analysis of ALT data
Wear, fatigue, deterioration and failure mechanisms to watch
Vibration and thermal cycles relate to fatigue
Data analysis examples  

 

HALT, HASS, ESS and Step-Stress (60 Minutes)

HALT approaches to design evaluation
Why ESS as an option, and what it does and does not
What does step-stress have to offer for test?
How to create an effective HASS

 

Summary (30 Minutes)
 
Appendix

Supplemental tables for ALT

 

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