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 Solving Reliability and Sustainability Problems in Systems Engineering through Government, Academia and Industry Collaboration |
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2013 Workshop on Accelerated Stress Testing & Reliability
Accelerating Reliability into the 21st Century
October 9 - 11, 2013San Diego, California
The challenge of managing Reliability in a dynamic global market is increasing. ASTR 2013 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.
Call for Presentation Topics
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Re-Thinking and Re-Visiting
Qualification Spec
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ASTR in Energy Efficient
Hardware/Systems
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Accelerated Testing & Field
Failures
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COTS Components in military
hardware/systems
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Failure Analysis (FA) &
Prognostics and Health Management
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Predictive Modeling & Field
Failures
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Accelerated Software Testing and
Analysis
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Product Robustness & Cost Control
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Accelerated Design Tool
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Future of AST techniques
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Future of testing within Medical
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Future of testing within Military
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Clean Tech
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Prognostics
Abstracts due: May 31st
Email abstract submissions to: don.gerstle@gmail.com
Presentation draft due: July 31st
Final presentation due: Sept 15th
Accelerated Reliability Growth Testing
Milena Krasich,
Senior Principal Systems Engineer, Raytheon IDS
This tutorial will cover the following topics:
1)
Reliability Growth Test overview/objectives
2) Explain traditional
Reliability Growth test methodology
3) Show shortcomings of the
traditional methods
4) Show principles of the Physics of Failure test
methodology
5) Show how the Reliability growth test based on PoF is
constructed
6) Show how the expected stresses are applied and
accelerated
7) Show reliability measures
8) Show advantages of the
test PoF test design and acceleration
9) Show achieved considerable
test cost reduction.
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 Wednesday
June 12: 11:30am EDT: Register https://www2.gotomeeting.com/register/283538530. |
40 Years of HALT: What Have
We Learned?
By: Mike Silverman, Founder/Managing Partner, Ops A La Carte
HALT began 40 years ago with a simple idea of testing beyond
specifications in order to better understand design margins. Over the past
40 years, thousands of engineers around the world have been exposed to the
concepts of HALT and have tried the techniques.
This tutorial will explore what we have learned in the past 40 Years and
what the future of HALT could be?
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Prognostics as a Tool for Reliable Systems
By: Doug
Goodman,
President of Ridgetop Group
Electronics are
the keystone to successful deployment of complex systems (50+ MPUs in an
automobile) Large MTBF and Statistical Process Control and Centering methods are not sufficient alone for reliability due to “outliers” (e.g. Toyota Prius, Deepwater Horizon Drilling Rig, Boeing 787)
Ridgetop technology exists to pinpoint degrading systems before they fail; supporting operational readiness objectives and cost-saving Prognostics/Health Management (PHM) and Condition Based Maintenance
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Wednesday
May 1: 11:30am PDT: Download slides Download / Stream slides with soundtrack |
Robust Design and Reliability Engineering Synergy
By:
Lou LaVallee, Senior Reliability Consultant,
Ops A La Carte
Robust Design (RD) Methodology is discussed for hardware development.
Comparison is made with reliability engineering (RE) tools and practices.
Differences and similarities are presented.
Proximity to ideal
function for robust design is presented and compared to physics of failure
and other reliability modeling and prediction approaches. Measurement
selection is shown to strongly differentiates RD and reliability
engineering methods. When and how to get the most from each methodology
is outlined. Pitfalls for each set of practices are also covered.
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Wednesday
April 10: 11:30am PDT |
| Sponsored by the IEEE CPMT Society and the ASQ Reliability Division |
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